Intensity-Product-Based Optical Sensing to Beat the Diffraction Limit in an Interferometer

Abstract

The classically defined minimum uncertainty of the optical phase is known as the standard quantum limit or shot-noise limit (SNL), originating in the uncertainty principle of quantum mechanics. Based on the SNL, the phase sensitivity is inversely proportional to K, where K is the number of interfering photons or statistically measured events. Thus, using a high-power laser is advantageous to enhance sensitivity due to the K gain in the signal-to-noise ratio. In a typical interferometer, however, the resolution remains in the diffraction limit of the K = 1 case unless the interfering photons are resolved as in quantum sensing. Here, a projection measurement method in quantum sensing is adapted for classical sensing to achieve an additional K gain in the resolution. To understand the projection measurements, several types of conventional interferometers based on N-wave interference are coherently analyzed as a classical reference and numerically compared with the proposed method. As a result, the Kth-order intensity product applied to the N-wave spectrometer exceeds the diffraction limit in classical sensing and the Heisenberg limit in quantum sensing, where the classical N-slit system inherently satisfies the Heisenberg limit of π/N in resolution.

Keywords

• optical sensing
• projection measurement
• many-wave interference
• higher-order intensity product