Enhancing Surface Sensitivity of Nanostructure-Based Aluminum Sensors Using Capped Dielectric Layers

• Kuang-Li Lee,
• Po-Cheng Tsai,
• Meng-Lin You,
• Ming-Yang Pan,
• Xu Shi,
• Kosei Ueno,
• Hiroaki Misawa,
• Pei-Kuen Wei

Affiliations

Kuang-Li Lee

Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan

Po-Cheng Tsai

Institute of Optoelectronic Sciences, National Taiwan Ocean University, Keelung, Taiwan

Meng-Lin You

Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan

Ming-Yang Pan

Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan

Xu Shi

Research Institute for Electronic Science, Hokkaido University, Hokkaido, Japan

Kosei Ueno

Research Institute for Electronic Science, Hokkaido University, Hokkaido, Japan

Hiroaki Misawa

Research Institute for Electronic Science, Hokkaido University, Hokkaido, Japan

Pei-Kuen Wei

Research Center for Applied Sciences, Academia Sinica, Taipei, Taiwan