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BIO Web of Conferences
(Jan 2024)
Contribution of residual gas and surface contaminants to contamination growth on irradiated samples
Schwartz Arne,
Müller Erich,
Eggeler Yolita
Affiliations
Schwartz Arne
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT)
Müller Erich
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT)
Eggeler Yolita
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT)
DOI
https://doi.org/10.1051/bioconf/202412922041
Journal volume & issue
Vol. 129
p. 22041
Abstract
Read online
No abstracts available.
Keywords
contamination
surface diffusion
electron microscopy
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