Experimental research of electronic products degradation

Abstract

With the help of accelerated tests we have obtained experimental data about the degradation of the functional parameters of three types of high-power transistors as the representatives of electronic products. Histograms of parameters’ distribution were constructed on the experimental data. It was found that the normal distribution law is deformed during the operation time and it poorly describe the parameters degradation for samples of products. The results of the degradation of the functional parameters are used for solving problems of group and individual forecasting of reliability of transistors taking into account the gradual failures.

Keywords

• electronic product
• transistor
• reliability
• degradation of parameters
• accelerated test