A New Parameter-Extraction Method for DGS and its Application to the Low-Pass Filter

Haiwen Liu; Xiaowei Sun; Zhengfan Li

doi:10.1080/08827510310001616812

Active and Passive Electronic Components (Jan 2004)

A New Parameter-Extraction Method for DGS and its Application to the Low-Pass Filter

Haiwen Liu,
Xiaowei Sun,
Zhengfan Li

Affiliations

Haiwen Liu: Department of Electronic Engineering, Shanghai Jiao Tong University, P.O. Box 006, No. 1954, Huashan Road, Shanghai 200030, China
Xiaowei Sun: Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
Zhengfan Li: Department of Electronic Engineering, Shanghai Jiao Tong University, P.O. Box 006, No. 1954, Huashan Road, Shanghai 200030, China

DOI: https://doi.org/10.1080/08827510310001616812
Journal volume & issue: Vol. 27, no. 2
pp. 119 – 123

Abstract

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A new and simple parameter-extraction method for the equivalent circuit of defected ground structure (DGS) is presented. Using this method, circuit simulation, based on the DGS equivalent-circuit model, show excellent agreements with the electromagnetic (EM) simulation. Further, our method is applied effectively to design a low-pass filter (LPF) with DGS. Comparison between simulation and measurement confirm the validity of the LPF configuration and design procedure. Simple structure and high power handling capability are obtained from the proposed LPF.

Published in Active and Passive Electronic Components

ISSN: 0882-7516 (Print); 1563-5031 (Online)
Publisher: Hindawi Limited
Country of publisher: United Kingdom
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://onlinelibrary.wiley.com/journal/5080

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