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BIO Web of Conferences
(Jan 2024)
Detection limits of electric field characterization at a p-n junction by 4D-STEM
da Silva Bruno Cesar,
Lu Yiran,
Wartelle Alexis,
Monroy Eva,
Rouviere Jean-Luc,
Cooper David,
den Hertog Martien
Affiliations
da Silva Bruno Cesar
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel
Lu Yiran
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel
Wartelle Alexis
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel
Monroy Eva
Univ. Grenoble-Alpes, CEA, Grenoble INP, IRIG, PHELIQS
Rouviere Jean-Luc
Univ. Grenoble-Alpes, CEA-IRIG, MEM
Cooper David
CEA, LETI, MINATEC
den Hertog Martien
Univ. Grenoble Alpes, CNRS, Grenoble INP, Institut Néel
DOI
https://doi.org/10.1051/bioconf/202412924006
Journal volume & issue
Vol. 129
p. 24006
Abstract
Read online
No abstracts available.
Keywords
4d-stem
electric field characterization
biasing
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