Applied Physics Express (Jan 2024)

Towards sub-10 nm spatial resolution by tender X-ray ptychographic coherent diffraction imaging

  • Nozomu Ishiguro,
  • Fusae Kaneko,
  • Masaki Abe,
  • Yuki Takayama,
  • Junya Yoshida,
  • Taiki Hoshino,
  • Shuntaro Takazawa,
  • Hideshi Uematsu,
  • Yuhei Sasaki,
  • Naru Okawa,
  • Keichi Takahashi,
  • Hiroyuki Takizawa,
  • Hiroyuki Kishimoto,
  • Yukio Takahashi

DOI
https://doi.org/10.35848/1882-0786/ad4846
Journal volume & issue
Vol. 17, no. 5
p. 052006

Abstract

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As the first experiment at BL10U in NanoTerasu, tender X-ray ptychographic coherent diffraction imaging (PCDI) was conducted using a photon energy of 3.5 keV. The ptychographic diffraction patterns from a 200 nm thick Ta test chart and a micrometer-sized particle of sulfurized polymer were collected. Subsequently, phase images were reconstructed with resolutions of sub-20 nm and sub-50 nm, respectively. In the near future, tender X-ray PCDI with sub-10 nm resolution is anticipated to potentially revolutionize the visualization of nanoscale structures and chemical states in various functional materials composed of light elements.

Keywords