Direct and Practical Identification for Back Focal Plane Based Surface Plasmon Microscopy

Abstract

We propose a practical approach to identify plasmonic absorption profile on back focal plane (BFP) of surface plasmon microscopy (SPM). Compared to previous morphology approaches, the proposed one features: i) it is applicable in BFP images with non-concentricity; ii) the algorithm of Fourier Correlation Analysis (FCA) maximizes SPP while minimizes random coherent noises, which makes it extremely suited for BFP images with significant low-quality; (iii) it takes much less time for one identification process and the entire identification can be operated automatically.

Keywords

• Surface plasmon microscopy (SPM)
• hough transform
• fourier correlation analysis (FCA)
• back focal plane (BFP).