Frontiers in Electronics (Jan 2024)
Demonstration of transfer learning using 14 nm technology analog ReRAM array
- Fabia Farlin Athena,
- Omobayode Fagbohungbe,
- Nanbo Gong,
- Malte J. Rasch,
- Jimmy Penaloza,
- SoonCheon Seo,
- Arthur Gasasira,
- Paul Solomon,
- Valeria Bragaglia,
- Steven Consiglio,
- Hisashi Higuchi,
- Chanro Park,
- Kevin Brew,
- Paul Jamison,
- Christopher Catano,
- Iqbal Saraf,
- Claire Silvestre,
- Xuefeng Liu,
- Babar Khan,
- Nikhil Jain,
- Steven McDermott,
- Rick Johnson,
- I. Estrada-Raygoza,
- Juntao Li,
- Tayfun Gokmen,
- Ning Li,
- Ruturaj Pujari,
- Fabio Carta,
- Hiroyuki Miyazoe,
- Martin M. Frank,
- Antonio La Porta,
- Devi Koty,
- Qingyun Yang,
- Robert D. Clark,
- Kandabara Tapily,
- Cory Wajda,
- Aelan Mosden,
- Jeff Shearer,
- Andrew Metz,
- Sean Teehan,
- Nicole Saulnier,
- Bert Offrein,
- Takaaki Tsunomura,
- Gert Leusink,
- Vijay Narayanan,
- Takashi Ando
Affiliations
- Fabia Farlin Athena
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Omobayode Fagbohungbe
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Nanbo Gong
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Malte J. Rasch
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Jimmy Penaloza
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- SoonCheon Seo
- IBM Research, Albany, NY, United States
- Arthur Gasasira
- IBM Research, Albany, NY, United States
- Paul Solomon
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Valeria Bragaglia
- IBM Research–Zurich, Rüschlikon, Switzerland
- Steven Consiglio
- TEL Technology Center, America, LLC, Albany, NY, United States
- Hisashi Higuchi
- TEL Technology Center, America, LLC, Albany, NY, United States
- Chanro Park
- IBM Research, Albany, NY, United States
- Kevin Brew
- IBM Research, Albany, NY, United States
- Paul Jamison
- IBM Research, Albany, NY, United States
- Christopher Catano
- TEL Technology Center, America, LLC, Albany, NY, United States
- Iqbal Saraf
- IBM Research, Albany, NY, United States
- Claire Silvestre
- IBM Research, Albany, NY, United States
- Xuefeng Liu
- IBM Research, Albany, NY, United States
- Babar Khan
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Nikhil Jain
- IBM Research, Albany, NY, United States
- Steven McDermott
- IBM Research, Albany, NY, United States
- Rick Johnson
- IBM Research, Albany, NY, United States
- I. Estrada-Raygoza
- IBM Research, Albany, NY, United States
- Juntao Li
- IBM Research, Albany, NY, United States
- Tayfun Gokmen
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Ning Li
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Ruturaj Pujari
- IBM Research, Albany, NY, United States
- Fabio Carta
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Hiroyuki Miyazoe
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Martin M. Frank
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Antonio La Porta
- IBM Research–Zurich, Rüschlikon, Switzerland
- Devi Koty
- TEL Technology Center, America, LLC, Albany, NY, United States
- Qingyun Yang
- TEL Technology Center, America, LLC, Albany, NY, United States
- Robert D. Clark
- TEL Technology Center, America, LLC, Albany, NY, United States
- Kandabara Tapily
- TEL Technology Center, America, LLC, Albany, NY, United States
- Cory Wajda
- TEL Technology Center, America, LLC, Albany, NY, United States
- Aelan Mosden
- TEL Technology Center, America, LLC, Albany, NY, United States
- Jeff Shearer
- TEL Technology Center, America, LLC, Albany, NY, United States
- Andrew Metz
- TEL Technology Center, America, LLC, Albany, NY, United States
- Sean Teehan
- IBM Research, Albany, NY, United States
- Nicole Saulnier
- IBM Research, Albany, NY, United States
- Bert Offrein
- IBM Research–Zurich, Rüschlikon, Switzerland
- Takaaki Tsunomura
- Tokyo Electron Limited, Tokyo, Japan
- Gert Leusink
- TEL Technology Center, America, LLC, Albany, NY, United States
- Vijay Narayanan
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- Takashi Ando
- IBM Thomas J. Watson Research Center, Yorktown Heights, NY, United States
- DOI
- https://doi.org/10.3389/felec.2023.1331280
- Journal volume & issue
-
Vol. 4
Abstract
Analog memory presents a promising solution in the face of the growing demand for energy-efficient artificial intelligence (AI) at the edge. In this study, we demonstrate efficient deep neural network transfer learning utilizing hardware and algorithm co-optimization in an analog resistive random-access memory (ReRAM) array. For the first time, we illustrate that in open-loop deep neural network (DNN) transfer learning for image classification tasks, convergence rates can be accelerated by approximately 3.5 times through the utilization of co-optimized analog ReRAM hardware and the hardware-aware Tiki-Taka v2 (TTv2) algorithm. A simulation based on statistical 14 nm CMOS ReRAM array data provides insights into the performance of transfer learning on larger network workloads, exhibiting notable improvement over conventional training with random initialization. This study shows that analog DNN transfer learning using an optimized ReRAM array can achieve faster convergence with a smaller dataset compared to training from scratch, thus augmenting AI capability at the edge.
Keywords
- resistive random access memory
- HfOx
- deep learning
- analog hardware
- transfer learning
- open loop training