Atomic mechanism of polarization-controlled surface reconstruction in ferroelectric thin films

Peng Gao; Heng-Jui Liu; Yen-Lin Huang; Ying-Hao Chu; Ryo Ishikawa; Bin Feng; Ying Jiang; Naoya Shibata; En-Ge Wang; Yuichi Ikuhara

doi:10.1038/ncomms11318

Nature Communications (Apr 2016)

Atomic mechanism of polarization-controlled surface reconstruction in ferroelectric thin films

Peng Gao,
Heng-Jui Liu,
Yen-Lin Huang,
Ying-Hao Chu,
Ryo Ishikawa,
Bin Feng,
Ying Jiang,
Naoya Shibata,
En-Ge Wang,
Yuichi Ikuhara

Affiliations

Peng Gao: Electron Microscopy Laboratory, School of Physics, Center for Nanochemistry, Peking University
Heng-Jui Liu: Department of Materials Science and Engineering, National Chiao Tung University
Yen-Lin Huang: Department of Materials Science and Engineering, National Chiao Tung University
Ying-Hao Chu: Department of Materials Science and Engineering, National Chiao Tung University
Ryo Ishikawa: Institute of Engineering Innovation, The University of Tokyo
Bin Feng: Institute of Engineering Innovation, The University of Tokyo
Ying Jiang: Collaborative Innovation Center of Quantum Matter
Naoya Shibata: Institute of Engineering Innovation, The University of Tokyo
En-Ge Wang: Collaborative Innovation Center of Quantum Matter
Yuichi Ikuhara: Institute of Engineering Innovation, The University of Tokyo

DOI: https://doi.org/10.1038/ncomms11318
Journal volume & issue: Vol. 7, no. 1
pp. 1 – 6

Abstract

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Miniature of electronic devices is attractive yet challenging due to structural variation at nanoscale. Here, Gao et al. report atomic imaging of reconstruction and unusual domain walls on Pb(Zr0.2Ti0.8)O3surfaces, providing possibilities to engineer nanoscale structural change.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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