Investigation on the Rapid Annealing of Ti-Au Composite Electrode on n-Type (111) CdZnTe Crystals

Haozhi Shi; Shulei Wang; Jijun Zhang; Zhubin Shi; Jiahua Min; Jian Huang; and Linjun Wang

doi:10.3390/cryst10030156

Crystals (Feb 2020)

Investigation on the Rapid Annealing of Ti-Au Composite Electrode on n-Type (111) CdZnTe Crystals

Haozhi Shi,
Shulei Wang,
Jijun Zhang,
Zhubin Shi,
Jiahua Min,
Jian Huang,
and Linjun Wang

Affiliations

Haozhi Shi: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Shulei Wang: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Jijun Zhang: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Zhubin Shi: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Jiahua Min: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
Jian Huang: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China
and Linjun Wang: Department of Electronic Information Materials, School of Materials Science and Engineering, Shanghai University, Shanghai 200444, China

DOI: https://doi.org/10.3390/cryst10030156
Journal volume & issue: Vol. 10, no. 3
p. 156

Abstract

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In this paper, the ohmic properties of Ti, Al, and Ti-Au composite electrodes on n-type (111) CdZnTe crystal deposited by vacuum evaporation method were first analyzed, and then the rapid annealing of Ti-Au electrode under Ar atmosphere with different temperature and time was explored. The ohmic property and barrier height were evaluated by current−voltage (I−V) and capacitance-voltage (C−V) measurements, and the adhesion strength of various electrodess to CdZnTe was compared. The Ti-Au electrode on CdZnTe showed the lowest leakage current and barrier height, and the highest adhesion strength among the three kinds of electrodes on (111) CdZnTe crystals. The rapid annealing of Ti-Au electrode under Ar atmosphere was proved to improve its ohmic property and adhesion strength, and the optimal annealing temperature and time were found to be 423 K and 6 min, respectively. The barrier height of the Ti-Au/CdZnTe electrode is 0.801 eV through rapid annealing for 6 min at 423 K annealing temperature, and the adhesion is 1225 MPa, which increases by 50% compared with that without rapid annealing.

Published in Crystals

ISSN: 2073-4352 (Online)
Publisher: MDPI AG
Country of publisher: Switzerland
LCC subjects: Science: Chemistry: Crystallography
Website: http://www.mdpi.com/journal/crystals/

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