Enhanced Soft Error Rate Estimation Technique for Aerospace Electronics Safety Design via Emulation Fault Injection

Abstract

In this paper, we propose Automatic Configuration Memory Fault Injection (ACMFI), a tool that calculates the architectural vulnerability factor (AVF) and soft error rate (SER) using the emulation fault injection technique. SER, which is essential for the safety design of aerospace electronics, can be obtained by experiments (beam tests) performed in a beam facility equipped with high-energy radiation facilities. However, SER calculation using beam tests has the disadvantage of a high cost and a long waiting time, making it difficult to use in the conceptual design stage, which is the aerospace system development stage and the initial HW/SW development stage. Using the emulation fault injection method, it is possible to estimate the SER, which can be used in the system safety design phase. This paper describes the ACMFI tool, which automatically performs emulation fault injection in SRAM-based FPGAs, which are widely used in aerospace electronic hardware. Unlike the existing methods, the proposed method has the advantage of minimizing the side effects by injecting faults into a dedicated SRAM area. In other words, the SER obtained by the proposed method can be estimated more accurately than the SER result obtained by the existing method. To prove the accuracy of the proposed test method, the SER calculated by performing an emulation fault injection test on the same FPGA was compared with the SER results tested at the beam facility. The method of obtaining SER using the proposed ACMFI gave results that were closer to the SER obtained by testing at the beam facility than the method of obtaining SER using the existing EMFI. The proposed method is used to calculate the failure rate, which is a key variable in determining the development assurance level when performing safety design tests in aerospace system development, enabling the development of safer systems and lower cost/higher quality aerospace electronic equipment than before.

Keywords

• soft error rate (SER)
• emulation fault injection
• architectural vulnerability factor (AVF)