Nanoscale Research Letters (Apr 2017)

The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO2-Based RRAM and Applications for Pattern Recognition

  • Zheng Zhou,
  • Chen Liu,
  • Wensheng Shen,
  • Zhen Dong,
  • Zhe Chen,
  • Peng Huang,
  • Lifeng Liu,
  • Xiaoyan Liu,
  • Jinfeng Kang

DOI
https://doi.org/10.1186/s11671-017-2023-y
Journal volume & issue
Vol. 12, no. 1
pp. 1 – 5

Abstract

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Abstract A binary spike-time-dependent plasticity (STDP) protocol based on one resistive-switching random access memory (RRAM) device was proposed and experimentally demonstrated in the fabricated RRAM array. Based on the STDP protocol, a novel unsupervised online pattern recognition system including RRAM synapses and CMOS neurons is developed. Our simulations show that the system can efficiently compete the handwritten digits recognition task, which indicates the feasibility of using the RRAM-based binary STDP protocol in neuromorphic computing systems to obtain good performance.

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