Quantitative Analysis for RBS and PIXE Spectrums of Thin Cu2ZnSnS4 (CZTS) Films

Abstract

The objective of this work is to introduce a different technique to existing studies that determine the stoichiometric ratios of thin CZTS structures. To this end, the CZTS targets were propagated by sol-gel process and later RBS and PIXE spectra were achieved by irradiating these samples with protons of 3.034 MeV energy into microbeam chamber. RBS spectrum was taken with RBS detector and PIXE spectra were collected with IGe and SDD detectors. As energy calibration was performed to these spectra and the RBS spectrum was fixed with the SIMNRA simulation program and the PIXE spectra adjusted with the Gaussian function. In the RBS spectrum, quantitative analysis measurements could not be performed due to the presence of Mo peak, which supplies electrical conductivity, while PIXE spectra results close to expected values. For this, least squares regression method were carried out PIXE spectra for the reference material, and the analytical elemental amount ratios for CZTS were specified with the calibration coefficients found. It was observed that the results acquired with the SDD detector were convenient with the required values, except sulfur content. This technique is a fast and simple method that can be employed analytically to help improve the accuracy of the existing methods in the literature that used to determine the constituent quantities and the depth analysis of thin films. However, this method should be compared with inverse least squares model or eigenvector quantitative analysis methods.

Keywords

• rbs
• pixe
• czts thin film
• proton