Daylight luminescence system for silicon solar panels based on a bias switching method

Abstract

Abstract Among the many characterization techniques for solar panel testing, two, electroluminescence (EL) and photoluminescence (PL), can provide useful visual information about the presence of different types of cell defects. EL is performed outdoors by night in commercial solar plants due to the very weak luminescence emission compared to sunlight. PL faces the added difficulty of needing to find a large‐area homogeneous light source to excite the modules. Since nighttime work poses many drawbacks and risks, a daylight outdoor EL/PL system would be useful for offering safe inspection of solar plants. We present daylight luminescence techniques based on a bias switching method, in which a pulsed luminescence signal is obtained by alternating the polarization state of the solar panels, synchronizing it with the luminescence image detection by an InGaAs camera. Fast switching and selecting an optimized exposure time are key to achieving high‐quality images. The daylight luminescence method described herein allows both EL and PL luminescence images to be obtained, even under high solar irradiance conditions.

Keywords

• cell defects
• daylight
• electroluminescence
• photoluminescence
• solar panels