On-Chip Temperature Compensation for Thermal Impedance Sensors

Martin Jaegle; Hans-Fridtjof Pernau; Marcus Pfützner; Mike Benkendorf; Xinke Li; Markus Bartel; Susanne Drost; Jürgen Wöllenstein

doi:10.3390/proceedings2131053

Proceedings (Nov 2018)

On-Chip Temperature Compensation for Thermal Impedance Sensors

Martin Jaegle,
Hans-Fridtjof Pernau,
Marcus Pfützner,
Mike Benkendorf,
Xinke Li,
Markus Bartel,
Susanne Drost,
Jürgen Wöllenstein

Affiliations

Martin Jaegle: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Hans-Fridtjof Pernau: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Marcus Pfützner: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Mike Benkendorf: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Xinke Li: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Markus Bartel: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Susanne Drost: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany
Jürgen Wöllenstein: Fraunhofer Institute for Physical Measurement Techniques IPM, 79110 Freiburg, Germany

DOI: https://doi.org/10.3390/proceedings2131053
Journal volume & issue: Vol. 2, no. 13
p. 1053

Abstract

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Electrical impedance spectroscopy is a widespread characterization method for solids or fluids in industrial applications. We here report on its thermal equivalent, the “thermal impedance spectroscopy”, improved by using a temperature compensation method for temperature dependent thermal measurements using an on-chip reference resistor.

Published in Proceedings

ISSN: 2504-3900 (Online)
Publisher: MDPI AG
Country of publisher: Switzerland
LCC subjects: General Works
Website: http://www.mdpi.com/journal/proceedings

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