AIP Advances (Jan 2017)

Erratum: “The role of defects in the electrical properties of NbO2 thin film vertical devices” [AIP Advances 6, 125006 (2016)]

  • Toyanath Joshi,
  • Pavel Borisov,
  • David Lederman

DOI
https://doi.org/10.1063/1.4974747
Journal volume & issue
Vol. 7, no. 1
pp. 019901 – 019901-2

Abstract

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