EPJ Web of Conferences (Jan 2018)

Development of the micro pixel chamber based on MEMS technology

  • Takemura T.,
  • Takada A.,
  • Kishimoto T.,
  • Komura S.,
  • Kubo H.,
  • Matsuoka Y.,
  • Miuchi K.,
  • Miyamoto S.,
  • Mizumoto T.,
  • Mizumura Y.,
  • Motomura T.,
  • Nakamasu Y.,
  • Nakamura K.,
  • Oda M.,
  • Ohta K.,
  • Parker J. D.,
  • Sawano T.,
  • Sonoda S.,
  • Tanimori T.,
  • Tomono D.,
  • Yoshikawa K.

DOI
https://doi.org/10.1051/epjconf/201817402010
Journal volume & issue
Vol. 174
p. 02010

Abstract

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Micro pixel chambers (μ-PIC) are gaseous two-dimensional imaging detectors originally manufactured using printed circuit board (PCB) technology. They are used in MeV gamma-ray astronomy, medicalimaging, neutron imaging, the search for dark matter, and dose monitoring. The position resolution of the present μ-PIC is approximately 120 μm (RMS), however some applications require a fine position resolution of less than 100 μm. To this end, we have started to develop a μ-PIC based on micro electro mechanical system (MEMS) technology, which provides better manufacturing accuracy than PCB technology. Our simulation predicted the gains of MEMS μ-PICs to be twice those of PCB μ-PICs at the same anode voltage. We manufactured two MEMS μ-PICs and tested them to study their behavior. In these experiments, we successfully operated the fabricatedMEMS μ-PICs and we achieved a maximum gain of approximately 7×103 and collected their energy spectra under irradiation of X-rays from 55Fe. However, the measured gains of the MEMS μ-PICs were less than half of the values predicted in the simulations. We postulated that the gains of the MEMS μ-PICs are diminished by the effect of the silicon used as a semiconducting substrate.

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