High-resolution cryo-EM structure of photosystem II reveals damage from high-dose electron beams

Abstract

Kato, Miyazaki, Hamaguchi et al. report the structure of Photosystem II in solution at 1.95 Å resolution by single-particle cryo-electron microscopy. They find that reducing the electron beam dosage decreases the electron beam damage while keeping the resolution of the cryo-EM structure, providing insights into the best practice for the determination of cryo-EM structures.