CMOS Multi-Matrix Optoelectronic System for High Speed Measurement of Main Mirror Deformation Large Diameter Radio Telescope

Abstract

A complementary metal-oxide semiconductor (CMOS) multi-matrix-based optoelectronic system is proposed and studied to measure the deformation of each connection point of a large full-rotatable radio telescope. The system is based on 18 multi-matrix base units. Theoretical investigations demonstrate that the system can provide real-time measurement of multi-point displacements quickly (within 21 seconds). Experimental investigations reveal that the actual measurement error of the photoelectric measurement unit designed in this paper is 0.024 mm. It is inferred that the measurement displacement error will not exceed 0.05 mm in an actual measurement of the full main mirror of the large diameter radio telescope, thus confirming the feasibility of the system.

Keywords

• Measuring deformations
• millimeter-range radio telescope
• multi-matrix measurement system
• optoelectronic system