On the frequency dependence of viscoelastic material characterization with intermittent-contact dynamic atomic force microscopy: avoiding mischaracterization across large frequency ranges

Abstract

Atomic force microscopy (AFM) is a widely use technique to acquire topographical, mechanical, or electromagnetic properties of surfaces, as well as to induce surface modifications at the micrometer and nanometer scale. Viscoelastic materials, examples of which include many polymers and biological materials, are an important class of systems, the mechanical response of which depends on the rate of application of the stresses imparted by the AFM tip. The mechanical response of these materials thus depends strongly on the frequency at which the characterization is performed, so much so that important aspects of behavior may be missed if one chooses an arbitrary characterization frequency regardless of the materials properties. In this paper we present a linear viscoelastic analysis of intermittent-contact, nearly resonant dynamic AFM characterization of such materials, considering the possibility of multiple characteristic times. We describe some of the intricacies observed in their mechanical response and alert the reader about situations where mischaracterization may occur as a result of probing the material at frequency ranges or with probes that preclude observation of its viscoelastic behavior. While we do not offer a solution to the formidable problem of inverting the frequency-dependent viscoelastic behavior of a material from dynamic AFM observables, we suggest that a partial solution is offered by recently developed quasi-static force–distance characterization techniques, which incorporate viscoelastic models with multiple characteristic times and can help inform dynamic AFM characterization.

Keywords

• dynamic atomic force microscopy
• generalized maxwell model
• loss modulus
• storage modulus
• viscoelasticity