Journal of Electrical and Electronics Engineering (May 2008)
A Method of Accelerated Life Testing for Multidimensional Process
Abstract
More complex processes and products must bedeveloped in shorter time and reliability must be deliveredin the first. In order to efficiently obtain performance data,yields reasonable estimates of the products life orperformance under normal operating condition, the paperpresents a method of reliability test for a multivariableprocess, generating the density function of the reliability bymeans of Bayes procedure.