IEEE Access (Jan 2019)

Unraveling the “U-Shaped” Dependence of Surface Flashover Performance on the Surface Trap Level

  • Shengtao Li,
  • Zhen Li,
  • Yin Huang,
  • Haoming Xu,
  • Farooq Aslam,
  • Daomin Min,
  • Weiwang Wang

DOI
https://doi.org/10.1109/ACCESS.2019.2958956
Journal volume & issue
Vol. 7
pp. 180923 – 180934

Abstract

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The effects of surface traps on surface flashover remain controversial. To clarify the relation between surface flashover and surface trap level, in this work, the surface trap level of epoxy composites was modified by nanoparticles incorporation, electron beam irradiation, and ozone treatment. Surface trap characteristics were analyzed by surface potential decay. Surface flashover voltages were measured in a vacuum for dc voltage and in SF6 for ac voltage. The “U-shaped” curve is founded to describe the relation between surface flashover voltage and surface deep trap level, surface flashover voltage first decreases and then increases with surface deep trap level. Enhancement of surface flashover voltage is attributed to reduced surface charge density, which was calculated by a double-trap flashover model. The simulation results indicate that the surface charge density on left side of “U-shaped” curve is controlled by surface shallow traps, whereas that on the right side is determined by surface deep traps. The effects of surface shallow and deep traps on surface charge accumulation and dissipation are used to demonstrate the reduced surface charges and improved surface flashover voltage for the “U-shaped” curve. The proposed “U-shaped” curve offers a promising way to improve surface flashover performance for high-voltage applications by tailoring surface trap characteristics with surface modifications.

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