APL Materials (Apr 2021)

Bandgap opening in layered gray arsenic alloy

  • Cheng Chen,
  • Chang Li,
  • Qiang Yu,
  • Xinyao Shi,
  • Yushuang Zhang,
  • Jie Chen,
  • Kaizhen Liu,
  • Ying He,
  • Kai Zhang

DOI
https://doi.org/10.1063/5.0042050
Journal volume & issue
Vol. 9, no. 4
pp. 041102 – 041102-7

Abstract

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As an essential member of group-V layered materials, gray arsenic (g-As) has recently begun to draw researchers’ attention due to fantastic physical properties predicted by theoretical calculation. However, g-As presents semimetal behavior as the thickness exceeds bilayers, which hinders its further device applications, such as in logic electronics. Herein, we report the growth of high quality gray arsenic–phosphorus–tin (g-AsPSn) alloys via a simple one-step chemical vapor transport process. The as-grown g-AsPSn alloy remains the same layered rhombohedral structure as g-As, while the g-AsPSn alloy shows an opened bandgap compared with g-As. Infrared absorption and photoluminescence spectra reveal a narrow optical bandgap of 0.2 eV. A field effect transistor based on few-layer g-AsPSn alloy flakes shows a typical p-type semiconductor behavior and a relatively high mobility of ∼66 cm2 V−1 S−1 under ambient conditions. It can be envisioned that the synthesized two-dimensional layered narrow-gap g-AsPSn alloy presents considerable potential applications in electronics and infrared optoelectronics.