Journal of Telecommunications and Information Technology (Jun 2023)

Monte Carlo method used for a prognosis of selected technological parameters

  • Małgorzata Langer

DOI
https://doi.org/10.26636/jtit.2007.3.838
Journal volume & issue
no. 3

Abstract

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In this paper a smart modeling approach for realistic simulation of selected technological parameters is presented. The technology of making contacts with plasma vapor deposition (PVD) method has been chosen for this purpose. The analysis is based on the Monte Carlo (MC) method and uses the Excel worksheet – the simplest tool, easily accessible to anyone. The statistic parameters are calculated and discussed as we introduce this experiment to demonstrate the advantages of design for six sigma (DFSS)

Keywords