ACS Omega (Oct 2023)

Accurate Measurement of Defect Generation Rates in Silicon Carbide Irradiated with Energetic Ions

  • Linxin Guo,
  • Shengyuan Peng,
  • Yong Liu,
  • Shang Tian,
  • Wei Zhou,
  • Hao Wang,
  • Jianming Xue

DOI
https://doi.org/10.1021/acsomega.3c07568
Journal volume & issue
Vol. 8, no. 44
pp. 41977 – 41982

Abstract

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