Using radio occultation-based electron density profiles for studying sporadic E layer spatial and temporal characteristics

Abstract

Abstract An improved method for identifying sporadic E (Es) layer properties from radio occultation (RO) electron density profiles (EDPs) is presented. The data used are sourced from COSMIC-1 RO EDPs collected between 2006 and 2019, which cover altitudes from 75 to 145 km. Initially, we evaluate the reliability of EDPs using the International Reference Ionosphere 2016 (IRI-2016) model and select only those profiles with a reliability score of 0.6 or higher (on a scale up to 1) for further analysis. Preliminary Es layer inversion results are obtained and validated against electron density data derived from ionosonde fbEs measurements, demonstrating a linear correlation with a coefficient of 0.72 and a mean absolute percentage error of 36.08%. Further verification using RO S4max data shows that this research method achieved an accuracy of 85.3% in identifying Es events. We perform a detailed analysis of Es layer relative occurrence rates, intensity, and thickness. The Es intensity is expressed by NmμEs (the layer’s maximum electron density (Nm) corresponding to the metal (μ) ion), which is estimated from the measured layer peak electron density NmEs by subtracting the ambient E region electron density NeE(hEs) at the height of the layer’s peak hEs, computed from the IRI-2016 model. Our findings reveal that Es layers predominantly occur in mid-latitude regions during summer, with average intensities between $$5\times {10}^{4 }\text{ and }8\times {10}^{4 }\text{el}/{\text{cm}}^{3}$$ 5 × 10 4 and 8 × 10 4 el / cm 3 . The most likely thickness of Es layers is approximately 1.4 km. Additionally, the present study shows that because NeE(hEs) increases during daytime, which leads to increases in NmEs, confirming that NmμEs is the proper parameter for assessing the Es layer intensity, in line with what is suggested by Haldoupis et al. (Haldoupis et al., J Atmos Sol Terr Phys 206:105327, 2020). Graphical Abstract

Keywords

• Electron density
• Sporadic-E layer
• Occurrence rate
• Es intensity
• Es thickness