GRID PATTERNS AS A MATHEMATICAL MODEL OF MULTIPLE ELEMENTS MEASURING DEVICES

Abstract

Computer modeling of measuring devices that contains matrix of electrodes are examined. Method of local weighted approximation is applied. Special location of the measurement nodes that forms a matrix structure (grid pattern) is applied for quadratic basis. It is shown that in this case either calculation of scalar or estimation of scalar derivatives in the central pattern node can be produced uniformly by prior finding of resolvent. Examples of usages of given method for finding the minimum of a function of two variables are considered. The possibility of using considered method for finding minimums of functions with discontinuities derivatives is specified.

Keywords

• локальна вагова апроксимація, оптимізація, кроковий пошук, патерн.