Improvement of thermally induced current bifurcation in VCSEL arrays with non-uniform series resistance design

Zhou Yuxin; Jin Dongyue; Lei Xin; Liu Yuanyuan; Zhang Wanrong; Xie Hongyun; Na Weicong; Dai Jlngfing; Wang Zhiyong

doi:10.1051/matecconf/202439501001

MATEC Web of Conferences (Jan 2024)

Improvement of thermally induced current bifurcation in VCSEL arrays with non-uniform series resistance design

Zhou Yuxin,
Jin Dongyue,
Lei Xin,
Liu Yuanyuan,
Zhang Wanrong,
Xie Hongyun,
Na Weicong,
Dai Jlngfing,
Wang Zhiyong

Affiliations

Zhou Yuxin: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Jin Dongyue: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Lei Xin: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Liu Yuanyuan: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Zhang Wanrong: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Xie Hongyun: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Na Weicong: Institute of Microelectronics, Faculty of Information Technology, Beijing University of Technology
Dai Jlngfing: Institute of Advanced Technology on Semiconductor Optics & Electronics, Institute of Laser Engineering, Faculty of Materials and Manufacturing, Beijing University of Technology
Wang Zhiyong: Institute of Advanced Technology on Semiconductor Optics & Electronics, Institute of Laser Engineering, Faculty of Materials and Manufacturing, Beijing University of Technology

DOI: https://doi.org/10.1051/matecconf/202439501001
Journal volume & issue: Vol. 395
p. 01001

Abstract

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Non-uniform series resistance design of VCSEL arrays is studied to improve thermally induced current bifurcation based on an electro-opto-thermal model of VCSEL arrays. Taking an 850nm VCSEL array with 4×4 cells for example, the impact of series resistance on current bifurcation is investigated. Increasmg series resistance is helpful to enhance the critical current values of current bifurcation point (Irc) and hence delay the current bifurcation phenomenon. For VCSEL array with non-uniform series resistance, Irc is increased by 28.6% and the total output optical power is enhanced by 14.3% when compared with that of VCSEL array with uniform series resistance. Therefore, non-uniform series resistance design is a better method for delaying the current bifurcation phenomenon and enhancuig the output optical power of VCSEL arrays.

Published in MATEC Web of Conferences

ISSN: 2261-236X (Online)
Publisher: EDP Sciences
Country of publisher: France
LCC subjects: Technology: Engineering (General). Civil engineering (General)
Website: http://www.matec-conferences.org

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