Light: Science & Applications (Mar 2022)

Correction: Deep learning in optical metrology: a review

  • Chao Zuo,
  • Jiaming Qian,
  • Shijie Feng,
  • Wei Yin,
  • Yixuan Li,
  • Pengfei Fan,
  • Jing Han,
  • Kemao Qian,
  • Qian Chen

DOI
https://doi.org/10.1038/s41377-022-00757-0
Journal volume & issue
Vol. 11, no. 1
pp. 1 – 3

Abstract

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