Materials Research Letters (Apr 2021)

Quantification of local dislocation density using 3D synchrotron monochromatic X-ray microdiffraction

  • Guangni Zhou,
  • Wolfgang Pantleon,
  • Ruqing Xu,
  • Wenjun Liu,
  • Kai Chen,
  • Yubin Zhang

DOI
https://doi.org/10.1080/21663831.2020.1862932
Journal volume & issue
Vol. 9, no. 4
pp. 182 – 188

Abstract

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A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.

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