APL Materials (Mar 2021)

Brain-inspired ferroelectric Si nanowire synaptic device

  • M. Lee,
  • W. Park,
  • H. Son,
  • J. Seo,
  • O. Kwon,
  • S. Oh,
  • M. G. Hahm,
  • U. J. Kim,
  • B. Cho

DOI
https://doi.org/10.1063/5.0035220
Journal volume & issue
Vol. 9, no. 3
pp. 031103 – 031103-6

Abstract

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We herein demonstrate a brain-inspired synaptic device using a poly(vinylidene fluoride) and trifluoroethylene (PVDF-TrFE)/silicon nanowire (Si NW) based ferroelectric field effect transistor (FeFET). The PVDF-TrFE/Si NW FeFET structure achieves reliable synaptic plasticity such as symmetrical potentiation and depression, thanks to the reversible dynamics of the PVDF-TrFE permanent dipole moment. The calculated asymmetric ratio of potentiation and depression is as low as 0.41 at the optimized bias condition, indicating a symmetrical synaptic plasticity behavior. Pattern recognition accuracy based on the actual synaptic plasticity data of the synaptic device can be estimated via the CrossSim simulation software. Our simulation result reveals a high pattern recognition accuracy of 85.1%, showing a potential feasibility for neuromorphic systems. Furthermore, the inverter-in-synapse transistor consisting of the Si NW FeFET synapse and resistor connected in series is able to provide energy-efficient logic circuits. A total noise margin [(NMH + NML)/VDD] of 41.6% is achieved, and the power consumption [Ps = VDD(ID,L + ID,H)/2] of the logic-in-synapse transistor is evaluated to be 0.6 µW per logic gate. This study would shed light on the way toward a brain-inspired neuromorphic computing system based on the FeFET synapse device.