Corrections to &#x201C;A Faster and Robust Artificial Neural Network Based Image Encryption Technique With Improved SSIM&#x201D;

Asisa Kumar Panigrahy; Shima Ramesh Maniyath; Mithileysh Sathiyanarayanan; Mohan Dholvan; T. Ramaswamy; Sudheer Hanumanthakari; N. Arun Vignesh; S. Kanithan; Raghunandan Swain

doi:10.1109/ACCESS.2024.3464189

IEEE Access (Jan 2024)

Corrections to “A Faster and Robust Artificial Neural Network Based Image Encryption Technique With Improved SSIM”

Asisa Kumar Panigrahy,
Shima Ramesh Maniyath,
Mithileysh Sathiyanarayanan,
Mohan Dholvan,
T. Ramaswamy,
Sudheer Hanumanthakari,
N. Arun Vignesh,
S. Kanithan,
Raghunandan Swain

Affiliations

Asisa Kumar Panigrahy: ORCiD; Department of ECE, Faculty of Science and Technology (Icfaitech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad, Telangana, India
Shima Ramesh Maniyath: Department of ECE, MVJ College of Engineering, Bengaluru, Karnataka, India
Mithileysh Sathiyanarayanan: Research & Innovation Centre, MIT Square, London, U.K.
Mohan Dholvan: Department of ECE, Sreenidhi Institute of Science and Technology, Hyderabad, Telangana, India
T. Ramaswamy: Department of ECE, Sreenidhi Institute of Science and Technology, Hyderabad, Telangana, India
Sudheer Hanumanthakari: ORCiD; Department of ECE, Faculty of Science and Technology (Icfaitech), ICFAI Foundation for Higher Education Hyderabad, Hyderabad, Telangana, India
N. Arun Vignesh: ORCiD; Department of ECE, Gokaraju Rangaraju Institute of Engineering and Technology (GRIET), Hyderabad, Telangana, India
S. Kanithan: Department of CSE, Jain University, Bengaluru, Karnataka, India
Raghunandan Swain: ORCiD; Department of ETC, Parala Maharaja Engineering College, Berhampur, India

DOI: https://doi.org/10.1109/ACCESS.2024.3464189
Journal volume & issue: Vol. 12
pp. 137522 – 137522

Abstract

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Presents corrections to the paper, Corrections to “A Faster and Robust Artificial Neural Network Based Image Encryption Technique With Improved SSIM”.

Published in IEEE Access

ISSN: 2169-3536 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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