Ellipsometry data analysis and ellipsometric spectra of complex materials

Abstract

Optical and structural properties of materials can be characterized by spectroscopic ellipsometry which represents an experimental technique that measures polarized light reflected from a material surface. Since the most complicated part of this method is data analysis and modeling, we present the calculation of the ellipsometric parameters for bi-isotropic materials. We consider the ellipsometric model for these materials which require not just permittivity like in conventional model, but also magnetic permeability and magneto electric coupling.

Keywords

• ellipsometry
• optical properties
• bi-isotropic materials
• Tellegen media