Accurate localization microscopy by intrinsic aberration calibration

Craig R. Copeland; Craig D. McGray; B. Robert Ilic; Jon Geist; Samuel M. Stavis

doi:10.1038/s41467-021-23419-y

Nature Communications (Jun 2021)

Accurate localization microscopy by intrinsic aberration calibration

Craig R. Copeland,
Craig D. McGray,
B. Robert Ilic,
Jon Geist,
Samuel M. Stavis

Affiliations

Craig R. Copeland: Microsystems and Nanotechnology Division, National Institute of Standards and Technology
Craig D. McGray: Quantum Measurement Division, National Institute of Standards and Technology
B. Robert Ilic: Microsystems and Nanotechnology Division, National Institute of Standards and Technology
Jon Geist: Quantum Measurement Division, National Institute of Standards and Technology
Samuel M. Stavis: Microsystems and Nanotechnology Division, National Institute of Standards and Technology

DOI: https://doi.org/10.1038/s41467-021-23419-y
Journal volume & issue: Vol. 12, no. 1
pp. 1 – 13

Abstract

Read online

The authors demonstrate accurate localization in three dimensions by comprehensive calibration of an ordinary microscope, exploiting the latent information of intrinsic aberrations. Rigid transformation of the emitter positions tests the method and enables measurements in six degrees of freedom.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

About the journal