Journal of Synchrotron Radiation (May 2022)

High-resolution electron time-of-flight spectrometers for angle-resolved measurements at the SQS Instrument at the European XFEL

  • Alberto De Fanis,
  • Markus Ilchen,
  • Alexander Achner,
  • Thomas M. Baumann,
  • Rebecca Boll,
  • Jens Buck,
  • Cyril Danilevsky,
  • Sergey Esenov,
  • Benjamin Erk,
  • Patrik Grychtol,
  • Gregor Hartmann,
  • Jia Liu,
  • Tommaso Mazza,
  • Jacobo Montaño,
  • Valerija Music,
  • Yevheniy Ovcharenko,
  • Nils Rennhack,
  • Daniel Rivas,
  • Daniel Rolles,
  • Philipp Schmidt,
  • Hamed Sotoudi Namin,
  • Frank Scholz,
  • Jens Viefhaus,
  • Peter Walter,
  • Pawel Ziółkowski,
  • Haiou Zhang,
  • Michael Meyer

DOI
https://doi.org/10.1107/S1600577522002284
Journal volume & issue
Vol. 29, no. 3
pp. 755 – 764

Abstract

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A set of electron time-of-flight spectrometers for high-resolution angle-resolved spectroscopy was developed for the Small Quantum Systems (SQS) instrument at the SASE3 soft X-ray branch of the European XFEL. The resolving power of this spectrometer design is demonstrated to exceed 10 000 (E/ΔE), using the well known Ne 1s−13p resonant Auger spectrum measured at a photon energy of 867.11 eV at a third-generation synchrotron radiation source. At the European XFEL, a width of ∼0.5 eV full width at half-maximum for a kinetic energy of 800 eV was demonstrated. It is expected that this linewidth can be reached over a broad range of kinetic energies. An array of these spectrometers, with different angular orientations, is tailored for the Atomic-like Quantum Systems endstation for high-resolution angle-resolved spectroscopy of gaseous samples.

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