Investigation of structural, temperature and frequency dependent dielectric behavior of Zn2SnO4@amorphous SiO2 core shell nanocomposites

Abstract

Herein, the detailed investigation of frequency and temperature dependent dielectric behavior of Zn2SnO4@SiO2 core shell nanocomposites (CSNs) is reported. Powder XRD analysis and FTIR spectral analysis were employed to comprehend the structure. The chemical and valence states are analyzed using XPS which confirms the existence of Zn, Sn, and SiO2, each with their distinctive Zn 2p, Sn 3d, and Si 2p valence states. The core shell formation is confirmed from their distinct color contrast in the TEM micrographs. The electrical response was investigated using impedance spectroscopy in the frequency range 1Hz-1 MHz at various temperatures. Positive temperature coefficient of resistance type behavior was established from impedance and modulus formalism. The total conductivity values were well fitted by the universal Jonscher law σtotal = σdc+ Aωn, and the temperature dependence of dc conductivity was discussed.

Keywords

• Nanocomposites
• X-ray photoelectron spectroscopy
• Transmission electron microscopy
• Dielectric properties