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Scientific Reports
(Jan 2023)
Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy
Andreas Hutzler,
Birk Fritsch,
Christian D. Matthus,
Michael P. M. Jank,
Mathias Rommel
Affiliations
Andreas Hutzler
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg
Birk Fritsch
Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg
Christian D. Matthus
Circuit Design and Network Theory, Technische Universität Dresden
Michael P. M. Jank
Fraunhofer Institute for Integrated Systems and Device Technology IISB
Mathias Rommel
Fraunhofer Institute for Integrated Systems and Device Technology IISB
DOI
https://doi.org/10.1038/s41598-023-28605-0
Journal volume & issue
Vol. 13, no. 1
pp. 1 – 1
Abstract
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No abstracts available.
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