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IUCrJ
(Mar 2022)
Sifting fluctuation scattering from microtextured samples
Antonio Cervellino
Affiliations
Antonio Cervellino
Swiss Light Source, Paul Scherrer Institut, Forschungstrasse 111, 5232 Villigen Switzerland
DOI
https://doi.org/10.1107/S2052252522002044
Journal volume & issue
Vol. 9, no. 2
pp. 167 – 168
Abstract
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No abstracts available.
Keywords
correlated fluctuations
dynamical studies
xfels
x-ray free-electron lasers
fluctuation scattering
preferred orientation
pair-angle distribution functions
intensity correlations
crystalline domains
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