The Experimental Conditions for Quantitative Determination of Trace Elements Si, Ta and W in Rare Polymetallic Ore by Electron Probe Microanalyzer

Abstract

BACKGROUND In recent years, the study of rare polymetallic ore tends to be increasingly detailed. As one of the important research methods, electron probe quantitative analysis has made great progress in trace element measurement. During analysis, in addition to increasing the beam size and time to reduce the detection limit, more attention should be paid to removing the interference from other elements, especially the main elements. During the routine testing of rare polymetallic samples, Si, Ta, W interfere with each other. Such interference affects the analytical results of trace elements, and is not easily detected due to its low content, thus affecting the accuracy of the final conclusion. OBJECTIVES To determine the interference relationship among Si, Ta and W under different analytical conditions. METHODS Taking SiO2, metal Ta and W of SPI as the research object, each element was analyzed under different conditions by electron probe microanalyzer. RESULTS In the analysis of silicate, TAP-Kα is used for Si, and LIF-Lα is recommended for Ta and W. In the analysis of niobium tantalum ore, it is suggested to use PET-Kα, PET-Mα and TAP-Mβ for Si, Ta and W, respectively; since 100% Ta will produce about 0.1% Si, therefore, the results are more accurate with the interference correction of Ta on Si. CONCLUSIONS It is important to understand the spectral peak stripping method and the principle of element interference and spectral peak overlap, adjusting the parameters according to the actual situation to ensure the accuracy of data.

Keywords

• rare polymetallic deposits
• silicon
• tantalum
• wolfram
• electron probe microanalyzer
• spectral interference