Materials Today Advances (Jun 2024)

Heteroepitaxially grown homojunction gallium oxide PN diodes using ion implantation technologies

  • Chih-Yang Huang,
  • Xin-Ying Tsai,
  • Fu-Gow Tarntair,
  • Catherine Langpoklakpam,
  • Thien Sao Ngo,
  • Pei-Jung Wang,
  • Yu-Cheng Kao,
  • Yi-Kai Hsiao,
  • Niall Tumilty,
  • Hao-Chung Kuo,
  • Tian-Li Wu,
  • Ching-Lien Hsiao,
  • Ray-Hua Horng

Journal volume & issue
Vol. 22
p. 100499

Abstract

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Although advancements in n- and p-doping of gallium oxide (Ga2O3) are underway, the realization of functional pn diodes remains elusive. Here, we present the successful fabrication of a Ga2O3 pn diode utilizing ion implantation technology. The Ga2O3 epilayers were grown on c-plane sapphire substrates by metalorganic chemical vapor deposition (MOCVD). P-type conductivity Ga2O3 epilayer, confirmed by Hall effect analysis, was achieved by phosphorus (P) ion implantation followed with a rapid thermal annealing (RTA) process. This p-Ga2O3 epilayer reveals a significant reduction in resistivity ( 3kT/q) and remained very low at 2✕10−8 A, as the diode operated at 150oC. The behavior could be due to Ga2O3 being a wide bandgap material.