A New Mirroring Circuit for Power MOS Current Sensing Highly Immune to EMI

Abstract

This paper deals with the monitoring of power transistor current subjected to radio-frequency interference. In particular, a new current sensor with no connection to the power transistor drain and with improved performance with respect to the existing current-sensing schemes is presented. The operation of the above mentioned current sensor is discussed referring to time-domain computer simulations. The susceptibility of the proposed circuit to radio-frequency interference is evaluated through time-domain computer simulations and the results are compared with those obtained for a conventional integrated current sensor.

Keywords

• current sensor
• CMOS integrated circuit
• smart power
• electromagnetic interference (EMI)
• electromagnetic compatibility (EMC)
• senseFET
• miller effect