X-ray Diffraction and Piezoelectric Studies during Tensile Stress on Epoxy/SbSI Nanocomposite

Abstract

In this paper, the performance of epoxy/SbSI nanocomposite under tensile stress was investigated. X-ray diffraction studies show the main stress mode has shear nature in the case of elastic deformation, while a combination of shear and tensile stress during plastic deformation caused lattice deformation of SbSI and shift of sulfur atoms along the c axis of the unit cell. Apart from that, the piezoelectric signals were recorded during tensile tests. Epoxy/SbSI nanocomposite responded to the applied tensile stress by generating a piezoelectric current with a relatively high value. The measured piezoelectric peak-to-peak current is relatively high (Ip-p = 1 pA) in comparison to the current flowing through the sample (8.16 pA) under an applied voltage of 100 V. The current level is independent of the deformation speed rate in contradistinction to complex stress states. The signal comes from the whole volume of the sample between electrodes and is generated by shear stress.

Keywords

• X-ray diffraction
• SbSI nanowires
• nanocomposite
• piezoelectricity
• strain sensor