Identification of two-dimensional layered dielectrics from first principles

Mehrdad Rostami Osanloo; Maarten L. Van de Put; Ali Saadat; William G. Vandenberghe

doi:10.1038/s41467-021-25310-2

Nature Communications (Aug 2021)

Identification of two-dimensional layered dielectrics from first principles

Mehrdad Rostami Osanloo,
Maarten L. Van de Put,
Ali Saadat,
William G. Vandenberghe

Affiliations

Mehrdad Rostami Osanloo: Department of Physics, The University of Texas at Dallas
Maarten L. Van de Put: Department of Materials Science and Engineering, The University of Texas at Dallas
Ali Saadat: Department of Materials Science and Engineering, The University of Texas at Dallas
William G. Vandenberghe: Department of Materials Science and Engineering, The University of Texas at Dallas

DOI: https://doi.org/10.1038/s41467-021-25310-2
Journal volume & issue: Vol. 12, no. 1
pp. 1 – 8

Abstract

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Developments in the field of two-dimensional van der Waals materials offer big promise for device applications. This study reports a first-principle investigation on the dielectric properties of 32 exfoliable two-dimensional layered dieletrics for assessing the prospects of these materials in devices.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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