AIP Advances (May 2023)

Deflected beam method for absolute current density determination

  • R. H. Mattish,
  • T. J. Burke,
  • P. R. Johnson,
  • C. E. Sosolik,
  • J. P. Marler

DOI
https://doi.org/10.1063/5.0144879
Journal volume & issue
Vol. 13, no. 5
pp. 055206 – 055206-6

Abstract

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We present a broadly applicable in situ method for profiling ion beams using electrostatic deflectors and a Faraday cup. By deconvolving the detector geometry from the resulting current profiles, spatially resolved absolute current density profiles are obtained. We demonstrate this method’s efficacy with low-density highly charged ion beams (specifically, Ne8+). Details on experimental design are provided as well as the link to the deconvolution routine on GitHub.