METHODS FOR IMPROVING METROLOGICAL PARAMETERS OF ΣΔ-ADC

Abstract

Background. ADC / DAC are one of the main elements of modern technical systems and, in general, most digital devices that interact with the environment. The Russian radio-electronic industry today cannot fully satisfy the existing requirements either in terms of the range of manufactured products, or in terms of the metrological and technicaloperational properties of data converters. Materials and methods. In the field of integrating type ADCs, high metrological characteristics of advanced sigma-delta ADC microcircuits are often achieved by the implementation of complex circuit solutions that ensure the minimization of methodological and instrumental conversion errors. Results and conclusions. The paper considers methods for improving the sigma-delta ADC in an algorithmic way. In particular, algorithms for generating a sweeping function for sigma-delta modulators based on continuous integrators are shown, which provide an increase in the oversampling factor and a decrease in the depth of modulation of the average voltage value at the output of the integrator.

Keywords

• sigma-delta adc
• sigma-delta adc modeling
• methods for improving the characteristics of sigma-delta adc
• elements of information-measuring systems
• adc conversion error