Measuring the topological charge and ellipticity of elliptic vortex

Xinjian Pan; Chongfu Zhang; Chunjian Deng; Zhili Li; Qing Wang

Alexandria Engineering Journal (Jun 2022)

Measuring the topological charge and ellipticity of elliptic vortex

Xinjian Pan,
Chongfu Zhang,
Chunjian Deng,
Zhili Li,
Qing Wang

Affiliations

Xinjian Pan: School of Electronic Information, University of Electronic Science and Technology of China, Zhongshan Institute, Zhongshan 528402, China; School of Information and Communication Engineering, Zhongshan Institute, University of Electronic Science and Technology of China, Chengdu 611731, China
Chongfu Zhang: School of Electronic Information, University of Electronic Science and Technology of China, Zhongshan Institute, Zhongshan 528402, China; School of Information and Communication Engineering, Zhongshan Institute, University of Electronic Science and Technology of China, Chengdu 611731, China
Chunjian Deng: School of Electronic Information, University of Electronic Science and Technology of China, Zhongshan Institute, Zhongshan 528402, China; School of Information and Communication Engineering, Zhongshan Institute, University of Electronic Science and Technology of China, Chengdu 611731, China
Zhili Li: School of Electronic Information, University of Electronic Science and Technology of China, Zhongshan Institute, Zhongshan 528402, China
Qing Wang: College of Science, JiuJiang University, Jiangxi 334000, China; Corresponding author.

Journal volume & issue: Vol. 61, no. 6
pp. 4323 – 4330

Abstract

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The intensities and phase profiles of the elliptic optics vortex beam both are determined by the topological charge (TC) and ellipticity. This paper presents an efficient and simple method for measuring the TC and ellipticity of elliptic vortex. By observing the diffraction patterns, the TC modulus and ellipticity can be probed with the suitable rectangular aperture, and the TC sign can be detected with the suitable right triangular aperture. The scheme works well even for high-order elliptic vortex with topological charge value as high as ± 18, and ellipticity range from 0.5 to 2 at least. Obviously, the measurement of TC and ellipticity have important research value for promoting the application of elliptical vortex.

Published in Alexandria Engineering Journal

ISSN: 1110-0168 (Print); 2090-2670 (Online)
Publisher: Elsevier
Country of publisher: Egypt
LCC subjects: Technology: Engineering (General). Civil engineering (General)
Website: http://www.journals.elsevier.com/alexandria-engineering-journal/

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