Crystallization in Zirconia Film Nano-Layered with Silica

Abstract

Gravitational waves are detected using resonant optical cavity interferometers. The mirror coatings’ inherent thermal noise and photon scattering limit sensitivity. Crystals within the reflective coating may be responsible for either or both noise sources. In this study, we explored crystallization reduction in zirconia through nano-layering with silica. We used X-ray diffraction (XRD) to monitor crystal growth between successive annealing cycles. We observed crystal formation at higher temperatures in thinner zirconia layers, indicating that silica is a successful inhibitor of crystal growth. However, the thinnest barriers break down at high temperatures, thus allowing crystal growth beyond each nano-layer. In addition, in samples with thicker zirconia layers, we observe that crystallization saturates with a significant portion of amorphous material remaining.

Keywords

• thin film
• nano-layering
• coating
• noise
• annealing
• XRD