APL Materials (Jan 2017)

Electronic structure of buried LaNiO3 layers in (111)-oriented LaNiO3/LaMnO3 superlattices probed by soft x-ray ARPES

  • F. Y. Bruno,
  • M. Gibert,
  • S. McKeown Walker,
  • O. E. Peil,
  • A. de la Torre,
  • S. Riccò,
  • Z. Wang,
  • S. Catalano,
  • A. Tamai,
  • F. Bisti,
  • V. N. Strocov,
  • J.-M. Triscone,
  • F. Baumberger

DOI
https://doi.org/10.1063/1.4973558
Journal volume & issue
Vol. 5, no. 1
pp. 016101 – 016101-7

Abstract

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Taking advantage of the large electron escape depth of soft x-ray angle resolved photoemission spectroscopy, we report electronic structure measurements of (111)-oriented [LaNiO3/LaMnO3] superlattices and LaNiO3 epitaxial films. For thin films, we observe a 3D Fermi surface with an electron pocket at the Brillouin zone center and hole pockets at the zone vertices. Superlattices with thick nickelate layers present a similar electronic structure. However, as the thickness of the LaNiO3 is reduced, the superlattices become insulating. These heterostructures do not show a marked redistribution of spectral weight in momentum space but exhibit a pseudogap of ≈50 meV.