Equivalent Measurement and Real-Time Compensation of Error Caused by Intensity Change in Deep Sub-Nanometer Displacement Measuring Interferometry

Abstract

Heterodyne interferometry is playing an increasingly important role in the field of high-end equipment manufacturing. In photolithography, the precision requirement of displacement metrology is increasing to a deep sub-nanometer scale with the decrease in the critical dimension of chips. The error caused by light intensity changes was investigated, and its principle was found to be related to the time difference in photoelectric conversion. On the basis of the analysis of dynamic characteristics of interference light intensity changes in a heterodyne Michaelson interferometer, the influencing factors, and the features of the measurement error, equivalent measurement and real-time compensation methods were investigated and proposed. Experiments revealed that the error was 220 pm using the method of best-gain detection, while it was 4.8 nm using the method of auto-gain detection over a wide dynamic range when the light intensity was reduced by 30%. However, the proposed compensation method successfully reduced the error to less than 40 pm. Therefore, the real-time compensation method based on equivalent measurement can maintain the signal-to-noise ratio while improving the precision of photoelectric conversion, removing the error caused by intensity changes, and helping heterodyne interferometry achieve deep sub-nanometer precision.

Keywords

• heterodyne interferometry
• avalanche photodiode
• error compensation
• displacement measurement